An approach for selecting switching devices for CFL ballasts

被引:0
|
作者
Laskai, L [1 ]
Ilic, M
机构
[1] Adv Energy Ind Inc, Ft Collins, CO 80525 USA
[2] GE Co, Corp Res & Dev, Schenectady, NY 12301 USA
关键词
compact fluorescent lamp ballast; cost; failure rate; reliability; switching device selection;
D O I
10.1109/28.903163
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper discusses a method for switching device selection for lowest overall compact fluorescent lamp (CFL) ballast cost while satisfying product life requirements. The inputs to selection process are lamp power, expected product life, and a range of semiconductor devices that satisfy electrical requirements of conventional half-bridge series-resonant ballast topology. The selection process is illustrated with the example of an n-channel MOSFET pair, complementary pair of an n- and p-channel MOSFETs, bipolar junction transistor pair, and a pair of insulated gate bipolar transistors. While this paper addresses switching device selection for CFL applications, the outlined approach is more universal and it can be applied to electronic equipment in general.
引用
收藏
页码:268 / 275
页数:8
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