Development of advanced sensing materials and interface structures for in-situ bioellipsometry

被引：0
|
作者：
Kalas, Benjamin [1 ]
Defforge, Thomas [2 ]
Gautier, Gael [2 ]
Chaix, Arnaud [2 ]
Fried, Miklos [1 ,3 ]
Petrik, Peter [1 ]
机构：
[1] Ctr Energy Res, Konkoly Thege Miklos Str 29 33, H-1121 Budapest, Hungary
[2] Univ Tours, CNRS, INSA Ctr Val Loire, GREMAN UMR 7347, Tours, France
[3] Obuda Univ, Inst Microelect & Technol, H-1431 Budapest, Hungary
来源：
LABEL-FREE BIOMEDICAL IMAGING AND SENSING (LBIS) 2022 | 2022年 / 11972卷
关键词：
Ellipsometry; Surface plasmon resonance; Dielectric structure; Porous nanoparticles; Biosensing; SURFACE-WAVES; ELLIPSOMETRY;
D O I：
10.1117/12.2609882
中图分类号：
Q2 [细胞生物学];
学科分类号：
071009 ; 090102 ;
摘要：
Materials in thin-film structures for optical sensing applications must have multiple features: (i) enhancing the optical signal providing high optical sensitivity for the measurement of the interface processes, (ii) having appropriate chemical properties for supporting the adsorption of the molecules to be detected, (iii) having stability and selectivity. Development of materials that meet all these requirements is an ever lasting process with a lot of opportunities. In this work we propose porous silicon nanoparticles for the detection of biomolecules in plasmonic and Bragg multilayer enhanced Kretschmann-Raether ellipsometry configurations.
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页数：7
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