Measurement of single event upsets in the ALICE-TPC front-end electronics

被引：0
|
作者：
Mager, M.
Musa, L.
Rehman, A.
Szczepankiewicz, A.
机构：
来源：
MECHANICAL AND AEROSPACE ENGINEERING, PTS 1-7 | 2012年 / 110-116卷
关键词：
single event upsets; TPC; ALICE; CERN;
D O I：
10.4028/www.scientific.net/AMM.110-116.4505
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
The Time Projection Chamber of the ALICE ex- periment at the CERN Large Hadron Collider features highly integrated on-detector read-out electronics. It is following the general trend of high energy physics experiments by placing the front-end electronics as close to the detector as possible-only some 10 cm away from its active volume. Being located close to the beams and the interaction region, the electronics is subject to a moderate radiation load, which allowed us to use commercial off-the-shelf components. However, they needed to be selected and qualified carefully for radiation hardness and means had to be taken to protect their functionality against soft errors, i.e. single event upsets.
引用
收藏
页码：4505 / 4511
页数：7
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