AES and XPS analyses of CuIn(S1-xSex)2 thin films grown by spray pyrolysis technique

被引：7

作者：

Ramaiah, KS ^{[1
]}

Raja, VS ^{[1
]}

机构：

[1] Sri Venkateswara Univ, Dept Phys, Tirupati 517502, Andhra Pradesh, India

来源：

SCRIPTA MATERIALIA | 2001年 / 44卷 / 05期

关键词：

XPS; AES; CuInSexS1-x; solar cell; thin films; binding energies and kinetic energies; semiconductor;

D O I：

10.1016/S1359-6462(00)00664-3

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) analyses of CuIn(S-1 Se-x(x))(2) thin films (x = 0.0, 0.5, 0.7 and 1.0) deposited by spray pyrolysis technique have been carried out. AES spectra of as-deposited films showed carbon, chlorine and oxygen as surface contaminants. Sputter etched spectra showed no tract of carbon and chlorine, but about 1.2% oxygen was found to be present. XPS analysis of CuIn(S1-xSex)(2) thin films prepared under optimized conditions revealed the absence of binary secondary phases. However, Cu2S or CuS was found to be secondary phase in CuIn(S0.5Se0.5)(2) thin films. (C) 2001 Scripta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.

引用

页码：771 / 777

页数：7

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