Metrological characterisation of analog-to-digital converters - A state of the art

被引：0

作者：

Arpaia, P ^{[1
]}

Cennamo, F ^{[1
]}

Daponte, P ^{[1
]}

机构：

[1] Univ Naples Federico II, Dipartimento Ingn Elettr, Naples, Italy

来源：

THIRD INTERNATIONAL CONFERENCE ON ADVANCED A/D AND D/A CONVERSION TECHNIQUES AND THEIR APPLICATIONS | 1999年 / 466期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The recent research on metrological testing of analog-to-digital converter-based measuring devices is analysed with the twofold aims of focusing both the contemporary situation and the imminent trends. Testing techniques are classified according to their dependence or Plot by the device architecture. In the former case, the studies on the most common dynamic tests, such as sine-fit, histogram, spectral analysis, and time base tests, are discussed. In the latter case, the research :activities on the two extreme architectures with very-high resolution and very-high real-time sampling frequency are reviewed.

引用

页码：134 / 144

页数：11

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