A complex solar X-ray and EUV imaging telescope design

被引：4
|
作者：
Bo, C [1 ]
Yan, G [1 ]
Ni, QL [1 ]
机构：
[1] Changchun Inst Opt Fine Mech & Phys, State Key Lab Appl Opt, Changchun, Peoples R China
来源：
TELESCOPES AND INSTRUMENTATION FOR SOLAR ASTROPHYSICS | 2004年 / 5171卷
关键词：
optical design; solar imaging telescope; X-ray; EUV;
D O I：
10.1117/12.505478
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
We report on the concept design and the theoretical ray trace analysis of the complex solar X-ray and EUV imaging telescope (CSIT) which is composed of a grazing incidence optical system and a normal incidence optical system. The CSIT can image the full sun in the wavelength bands from 0.4 to 6 nm and one EUV wavelength of 19.5nm with the same detector. The CSIT is a compact structure and can satisfy top-level image quality requirements.
引用
收藏
页码：155 / 159
页数：5
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