Vacuum-free photolithographic patterning of conducting polymer film

被引:1
|
作者
Kim, Woo Young [1 ]
Lee, Hee Chul [2 ]
机构
[1] Korea Adv Inst Sci & Technol, Dept Mech Engn, Daejeon 706091, South Korea
[2] Korea Adv Inst Sci & Technol, Dept Elect Engn, Daejeon 706091, South Korea
来源
MICRO & NANO LETTERS | 2016年 / 11卷 / 12期
关键词
polymer films; conducting polymers; photoresists; masks; etching; microfabrication; conducting polymer film; vacuum-free patterning; photolithography; short-term air-blowing process; photoresist; mask patterns; all-solution-based process; organic devices; micropatterning; wet etching; SOFT LITHOGRAPHY; SOLAR-CELLS; ORGANIC MEMORY;
D O I
10.1049/mnl.2016.0479
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Understanding the relationship between a certain organic material and the corresponding orthogonal solvent improves the realistic possibility of photolithographic patterning during the fabrication of organic devices. However, an all-solution-based patterning process has not been established because the dry-etching process used for micropatterning must be performed in a vacuum chamber, which is not appropriate for a printing process and results in a low throughput of products at the industrial level. Here, we demonstrate a vacuum-free patterning method using conventional photolithography. It is a main breakthrough in that it washes away the etchant by blowing with air in a very short time. This short-term air-blowing process dramatically reduces the undercut below the photoresist. As a result, mask patterns of nearly the same size could be transferred onto an organic object. Compared with ordinary wet etching process, the undercut is reduced to the 1-micrometer scale, allowing the realisation of a fine pattern size. The process developed here will enhance the throughput of manufacturing systems using an all-solution-based process.
引用
收藏
页码:807 / 810
页数:4
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