Quantitative vector magnetometry using generalized magneto-optical ellipsometry

We recently developed the method of generalized magneto-optical ellipsometry (GME), which enabled us to achieve a complete magneto-optical characterization of a magnetic material, including the magnetization orientation. For the present study, we have modified our original setup to allow for measurements at arbitrary external fields including entire field scans. Consequently, GME can be used as a tool to perform vector magnetometry measurements. In this article, we present our first experimental results on polycrystalline Co films which demonstrate the feasibility of GME as a magneto-optical vector magnetometer. (C) 1999 American Institute of Physics. [S0021-8979(99)41608-1].