Design Rules for High Performance Tunnel Transistors From 2-D Materials

被引:23
|
作者
Ilatikhameneh, Hesameddin [1 ]
Klimeck, Gerhard [1 ]
Appenzeller, Joerg [1 ]
Rahman, Rajib [1 ]
机构
[1] Purdue Univ, Dept Elect & Comp Engn, W Lafayette, IN 47907 USA
来源
关键词
2D materials; tunnel transistors; transition metal dichalcogenides; WSe2; scaling theory; electrical doping; FETS;
D O I
10.1109/JEDS.2016.2568219
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Tunneling field-effect transistors (TFETs) based on 2-D materials are promising steep sub-threshold swing devices due to their tight gate control. There are two major methods to create the tunnel junction in these 2-D TFETs: 1) electrical and 2) chemical doping. In this paper, design guidelines for both electrically and chemically doped 2-D TFETs are provided using full band atomistic quantum transport simulations in conjunction with analytic modeling. Moreover, several 2-D TFETs' performance boosters such as strain, source doping, and equivalent oxide thickness are studied. Later on, these performance boosters are analyzed within a novel figure-of-merit plot (i.e., constant ON-current plot).
引用
收藏
页码:260 / 265
页数:6
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