Quantum Metrology with Entangled Coherent States

被引：420
|
作者：
Joo, Jaewoo [1 ]
Munro, William J. [1 ,2 ]
Spiller, Timothy P. [1 ]
机构：
[1] Univ Leeds, Sch Phys & Astron, Leeds LS2 9JT, W Yorkshire, England
[2] NTT Corp, NTT Basic Res Labs, Atsugi, Kanagawa 2430198, Japan
来源：
PHYSICAL REVIEW LETTERS | 2011年 / 107卷 / 08期
关键词：
INTERFEROMETER;
D O I：
10.1103/PhysRevLett.107.083601
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We present an improved phase estimation scheme employing entangled coherent states and demonstrate that these states give the smallest variance in the phase parameter in comparison to NOON, "bat,'' and "optimal'' states under perfect and lossy conditions. As these advantages emerge for very modest particle numbers, the optical version of entangled coherent state metrology is achievable with current technology.
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页数：4
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