Influence of Copper Concentration on the Structural and Optical Properties of Chemically Deposited CuSbS2 Thin Films

被引：1

作者：

Vijila, Jebadurai Joy Jeba ^{[1
]}

Mohanraj, Kannusamy ^{[1
]}

Thanikaikarasan, Sethuramachandran ^{[2
]}

Sivakumar, Ganesan ^{[3
,4
]}

Mahalingam, Thaiyan ^{[5
]}

Ixtlilco, Luis ^{[6
]}

机构：

[1] Manonmaniam Sundaranar Univ, Dept Phys, Tirunelveli 627012, Tamil Nadu, India

[2] PSN Coll Engn & Technol, Sch Basic Engn & Sci, Ctr Sci & Appl Res, Tirunelveli 627152, Tamil Nadu, India

[3] Annamalai Univ, Dept Phys, Ctr Instrumentat, Annamalainagar 608002, Tamil Nadu, India

[4] Annamalai Univ, Dept Phys, Lab Serv, Annamalainagar 608002, Tamil Nadu, India

[5] Ajou Univ, Dept Elect & Comp Engn, Suwon 443749, South Korea

[6] Univ Politecn Estado Guerrero, Taxco, Guerrero, Mexico

来源：

JOURNAL OF NEW MATERIALS FOR ELECTROCHEMICAL SYSTEMS | 2016年 / 19卷 / 01期

关键词：

CuSbS2; Chemical Bath Deposition; Field Emission Scanning Electron Microscopy;

D O I：

10.14447/jnmes.v19i1.342

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

Thin films of CuSbS2 have been deposited on ultrasonically cleaned glass substrates using a simple chemical bath deposition technique. Prepared films have been characterized using X-ray diffraction, Field Emission Scanning Electron Microscopy and UV-Vis-NIR spectroscopic techniques, respectively. X-ray diffraction analysis revealed that the prepared films possess polycrystalline in nature with orthorhombic CuSbS2 in addition to secondary phase of monoclinic Cu3SbS3 and cubic Cu12Sb4S13 for different copper concentrations. Field Emission Scanning Electron Spectroscopic analysis showed that the prepared films possess spherical shaped grains with irregular shaped clusters. Optical absorption analysis showed that the prepared films possess band gap value in the range between 1.7 and 2.4 eV.

引用

页码：15 / 19

页数：5

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