Extended life PZT stack test fixture

被引:1
|
作者
Badescu, M. [1 ]
Sherrit, S. [1 ]
Bao, X. [1 ]
Aldrich, J. [1 ]
Bar-Cohen, Y. [1 ]
Jones, C. [1 ]
机构
[1] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
关键词
extended life test; test fixtures; piezoelectric stacks;
D O I
10.1117/12.776483
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Piezoelectric stacks are being sought to be used as actuators for precision positioning and deployment of mechanisms in future planetary missions. Beside the requirement for very high operation reliability, these actuators may be required to operate in space environments that are considered harsh compared to normal terrestrial conditions. These environmental conditions include low and high temperatures and vacuum or high pressure. Additionally, the stacks are subjected to high stress and in some applications need to operate for extended time periods. Many of these requirements are beyond the current industry design margins for nominal terrestrial applications. In order to investigate some of the properties to assess the durability of such actuators and their limitations we have developed a new type of test fixture that can be easily integrated in various test chambers for simulating environmental conditions, can provide access for multiple measurements while being exposed to adjustable stress levels. We have designed and built two versions of these test fixture and these fixtures were made to be adjustable for testing stacks with different dimensions and can be easily used in small or large numbers. The properties that were measured using these fixtures include impedance, capacitance, dielectric loss factor, leakage current, displacement, breakdown voltage, and lifetime performance. The fixtures characteristics and the test capabilities are presented in this paper.
引用
收藏
页数:7
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