Kinetically Controlled Epitaxial Growth of Fe3GeTe2 van der Waals Ferromagnetic Films

被引:3
|
作者
Zhou, Wenyi [1 ]
Bishop, Alexander J. [1 ]
Zhu, Menglin [2 ]
Lyalin, Igor [1 ]
Walko, Robert [1 ]
Gupta, Jay A. [1 ]
Hwang, Jinwoo [2 ]
Kawakami, Roland K. [1 ]
机构
[1] Ohio State Univ, Dept Phys, Columbus, OH 43210 USA
[2] Ohio State Univ, Dept Mat Sci & Engn, Columbus, OH 43210 USA
关键词
2D materials; van der Waals magnet; ferromagnetism; molecular beam epitaxy; growth kinetics; transmission electron microscopy; magnetic circular dichroism; spin-polarized scanning tunneling microscopy; MAGNETIC-PROPERTIES;
D O I
10.1021/acsaelm.2c00185
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We demonstrate that kinetics play an important role in the epitaxial growth of Fe3GeTe2 (FGT) van der Waals (vdW) ferromagnetic films by molecular beam epitaxy. By varying the deposition rate, we control the formation or suppression of an initial tellurium-deficient non-van-der-Waals phase (Fe3Ge2) prior to realizing epitaxial growth of the vdW FGT phase. Using cross-sectional scanning transmission electron microscopy and scanning tunneling microscopy, we optimize the FGT films to have atomically smooth surfaces and abrupt interfaces with the Ge(111) substrate. The magnetic properties of our high quality material are confirmed through magneto-optic, magnetotransport, and spin-polarized STM studies. Importantly, this demonstrates how the interplay of energetics and kinetics can help tune the re-evaporation rate of chalcogen atoms and interdiffusion from the underlayer, which paves the way for future studies of van der Waals epitaxy.
引用
收藏
页码:3190 / 3197
页数:8
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