Monte Carlo simulation of projections in computed tomography

被引:6
|
作者
Chyba, B. [1 ]
Mantler, M. [1 ]
Reiter, M. [2 ]
机构
[1] Vienna Univ Technol, A-1040 Vienna, Austria
[2] Upper Austria Univ Appl Sci, Wels, Austria
关键词
Monte Carlo simulation; computed tomography; industrial metrology; fundamental parameters;
D O I
10.1154/1.2919045
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Results from Monte Carlo simulations of two-dimensional projections for a simple real sample (an aluminium cube with a cylindrical hole filled by air or steel) in a realistic experimental environment are presented. A meaningful comparison with measurements was therefore possible. Coherent and incoherent scattering as well as excitation of fluorescent radiation are accounted for; multiple sequences of these interactions are followed up to a selectable order. Such simulations are important aids to modern metrological applications of computed tomography where the dimensional accuracy of hidden or inaccessible components of work pieces is determined. The complex process requires a high level of optimization of the instrumental parameters for each sample type whereby the accurate simulation of the physical interactions between X-rays and the sample material is a supplement and alternative to time consuming measurements. (c) 2008 International Centre for Diffraction Data.
引用
收藏
页码:150 / 153
页数:4
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