共 50 条
- [1] IN-PLANE DISPLACEMENT MEASUREMENT BY SPECKLE INTERFEROMETRY [J]. NON-DESTRUCTIVE TESTING, 1975, 8 (04): : 177 - 180
- [2] Speckle shear photography using photorefractive crystals for in-plane strain measurement [J]. OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION III, 2003, 5144 : 562 - 570
- [4] The Extension of the Electronic Speckle Photography to the Measurement of In-Plane Displacement [J]. MAPAN, 2018, 33 : 377 - 384
- [6] The Extension of the Electronic Speckle Photography to the Measurement of In-Plane Displacement [J]. MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA, 2018, 33 (04): : 377 - 384
- [7] Photorefractive holographic interferometry for the measurement of object tilt and in-plane displacement [J]. OPTICAL INFORMATION PROCESSING TECHNOLOGY, 2002, 4929 : 230 - 236
- [8] In-plane displacement measurement of digital speckle photography based on EALCD [J]. Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument, 2010, 31 (08): : 1808 - 1812