On the prediction of near-field microcontroller emission

被引：0

作者：

Sicard, E ^{[1
]}

Boyer, A ^{[1
]}

Tankielun, A ^{[1
]}

机构：

[1] INSA, Toulouse, France

来源：

EMC 2005: IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, VOLS 1-3, PROCEEDINGS | 2005年

关键词：

IC; parasific emission; near-field scanning; dipole;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper details a predictive approach for the evaluation of the magnetic field radiated by microcontrollers. The simulation is based on the radiation of elementary current dipoles corresponding to the current flowing in supply inductances. A CMOS test chip including six microcontroller cores has been scanned for validation purpose. Preliminary comparison show interesting similarities between measured and simulated scan, which build a valuable link between electrical macro-models and near-field electromagnetic formulations.

引用

页码：695 / 699

页数：5

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