共 50 条
- [3] TRANSMISSION SCANNING ELECTRON-MICROSCOPES SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1980, 47 (05): : 296 - 304
- [5] High performance feedback for fast scanning atomic force microscopes REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (08): : 3320 - 3327
- [6] LIMITS OF TOPOGRAPHIC MEASUREMENT BY THE SCANNING TUNNELLING AND ATOMIC FORCE MICROSCOPES JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 611 - 618
- [7] Towards Automatic Control of Scanning Transmission Electron Microscopes 2009 IEEE CONTROL APPLICATIONS CCA & INTELLIGENT CONTROL (ISIC), VOLS 1-3, 2009, : 788 - 793
- [9] Structure and bonding at the atomic scale by scanning transmission electron microscopy Nature Materials, 2009, 8 : 263 - 270