Ultrafast dynamics of antiferromagnetic order studied by femtosecond resonant soft x-ray diffraction

被引：19
|
作者：
Holldack, K. [1 ]
Pontius, N. [1 ]
Schierle, E. [1 ]
Kachel, T. [1 ]
Soltwisch, V. [1 ]
Mitzner, R. [1 ]
Quast, T. [1 ]
Springholz, G. [2 ]
Weschke, E. [1 ]
机构：
[1] Helmholtz Zentrum Berlin Mat & Energie, D-12489 Berlin, Germany
[2] Johannes Kepler Univ Linz, Inst Halbleiterphys, A-4040 Linz, Austria
来源：
APPLIED PHYSICS LETTERS | 2010年 / 97卷 / 06期
基金：
奥地利科学基金会;
关键词：
antiferromagnetic materials; magnetic semiconductors; magnetic thin films; semiconductor thin films; X-ray diffraction; SYNCHROTRON-RADIATION; PULSES; NICKEL;
D O I：
10.1063/1.3474612
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Femtosecond (fs) soft x-ray diffraction at the Eu-M(5) resonance was employed to study the dynamics of antiferromagnetic (AFM) order in a thin film of the magnetic semiconductor EuTe after fs laser excitation. The AFM Bragg peak intensity displays an ultrafast decay with an upper limit for the time constant of (700 +/- 200) fs followed by fast recovery with (47 +/- 10) ps. Reciprocal space scans across the diffraction peak could be recorded with picosecond and fs time resolution, demonstrating that even at synchrotron slicing sources ultrafast studies of spatial magnetic correlations are feasible. The results show that fs dynamics of materials with complex order parameters can be addressed. (C) 2010 American Institute of Physics. [doi:10.1063/1.3474612]
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页数：3
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