The sub-micron resolution X-ray spectroscopy beamline at NSLS-II

For many research areas such as life, environmental, earth or material sciences, novel analytical resources have to be developed for an advance understanding of complex natural and engineered systems that are heterogeneous on the micron to the tenths of microns scale. NSLS-II at BNL will be a synchrotron radiation source with an ultra-high brilliance delivering a high current (500 mA). One of the 1st six NSLS-II beamlines will be the Sub-micron Resolution X-ray spectroscopy beamline (SRX), dedicated as an analytical tool to study complex systems on a sub-micron length scale. SRX will comprise two branches thanks to a canted setup with two undulators: the first branch using Kirkpatrick-Baez mirrors as focusing optics will cover the energy range of 4.65-23 keV, allowing for XANES experiments from the Ti to the Rh K-edge. Thanks to a horizontally deflecting double crystal monochromator with maximum stability, a set of slits located on the secondary source, and two sets of complementary and quickly interchangeable KB mirrors, spectroscopy with very high spectral and spatial resolution will be achieved. The spot size will almost fully cover a range from 60 x 60 to 1300 x 500 nm(2), providing an attractive adaptability of the observation scale. A 1.5 m long IVU21 will serve as a light source. The expected high flux in a sub-micron-spot (5 x 10(12) and 7 x 10(13) ph s(-1) at maximum and lowest resolutions) will open new possibilities for spectromicroscopy of trace elements. The 2nd canted undulator will serve as an independent light source for the second branch designed for experiments with X-ray energies in the range of 2-15 key. Using Fresnel zone plates, the spatial resolution aimed for is around 30 nm with up to 7 x 10(9) ph s(-1) in the spot. This branch would be attractive for many biological applications from life and environmental science due to low-Z elements of interest within that energy range. In both experimental stations, X-ray fluorescence will be used for imaging, spectroscopy, tomography and mu-diffraction experiments. Published by Elsevier B.V.