Characterizing Particle Background of ATHENA WFI for the Science Products Module: Swift XRT Full Frame and XMM-PN Small Window Mode Observations

被引：2

作者：

Bulbul, Esra ^{[1
]}

Kraft, Ralph ^{[1
]}

Nulsen, Paul ^{[1
]}

Miller, Eric ^{[2
]}

Grant, Catherine ^{[2
]}

Bautz, Mark ^{[2
]}

Burrows, David N. ^{[3
]}

Allen, Steven ^{[4
]}

机构：

[1] Harvard Smithsonian Ctr Astrophys, 60 Garden St, Cambridge, MA 02138 USA

[2] MIT, Kavli Inst Astrophys & Space Res, 77 Massachusetts Ave, Cambridge, MA 02139 USA

[3] Penn State Univ, Dept Astron & Astrophys, 525 Davey Lab, University Pk, PA 16802 USA

[4] Stanford Univ, Dept Phys, 382 Via Pueblo Mall, Stanford, CA 94305 USA

来源：

SPACE TELESCOPES AND INSTRUMENTATION 2018: ULTRAVIOLET TO GAMMA RAY | 2018年 / 10699卷

关键词：

D O I：

10.1117/12.2313717

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

The Wide Field Imager (WFI) is one of two focal plane detector systems of ESA's Advanced Telescope for High ENergy Astrophysics (ATHENA) X-ray observatory. The Science Products Module (SPM) will have on-board processing algorithms that will reduce the ATHENA WFI particle background level significantly by improving background rejection on board and in post-processing on the ground. To this end, we examine the full frame observations from existing X-ray telescopes to understand and characterize the physics of the particle background. In particular, we determine phenomenological correlations between high energy particle events and X-ray events to improve the rejection of particle background events. We will present our results from the Swift XRT and XMM-Newton PN full frame data analysis in this talk. We will also discuss how these results could be used to reduce the expected background in the ATHENA WFI observations by the SPM processing.

引用

页数：6