A recovery algorithm for frequency-domain layered finite element analysis of large-scale high-frequency integrated circuits

被引：0

作者：

Jiao, Dan ^{[1
]}

机构：

[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA

来源：

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 2007年 / 17卷 / 08期

关键词：

finite element method (FEM); high frequency; integrated circuits (ICs);

D O I：

10.1109/LMWC.2007.901752

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A recovery algorithm is proposed for the frequency domain layered finite element analysis of large-scale high-frequency integrated circuits. Given the solution in one layer, this algorithm can recover the solutions in other layers with single-layer computational complexity. Numerical and experimental results are given to demonstrate its validity.

引用

页码：553 / 555

页数：3

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