Design of a K-Band High-Efficiency Power Amplifier in 45 nm SOI CMOS Technology

被引:0
|
作者
Chen, Liying [1 ,2 ]
Wang, Hao [1 ,2 ]
Zhao, Junfa [1 ,2 ]
Zhang, Simin [1 ]
机构
[1] Tiangong Univ, Schl Elect & Informat Engn, Tianjin, Peoples R China
[2] Tianjin Key Lab Photoelect Detect Technol & Syst, Tianjin, Peoples R China
关键词
CMOS; SOIK-band; power amplifier (PA); current-reuse; resistance feedback;
D O I
10.1080/10584587.2021.1911300
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a high efficiency K-band CMOS power amplifier (PA) in GlobalFoundries (GF) 45 nm SOI CMOS technology for 5 G applications. Compared with an ordinary two-stage PA, the PA uses a current-reused technique to enhance the power gain and efficiency within the frequency band. The resistance feedback structure of the power output stage improves the gain flatness and the output bandwidth, and reduces the matching components. The simulation results show that the output power (Pout) is more than 21.6 dBm from 18 to 27 GHz, while the small signal gain (S21) is more than 30.6 dB, the output 1 dB compression point (OP1dB) is 19.8 dBm and power-added efficiency (PAE) is 36.8%. With a 64-QAM LTE signal with 20-MHz bandwidth, adjacent channel leakage ratio (ACLR) is -31.2 dBc and the error vector amplitude(EVM) is less than - 26.7 dB at an average output power of 10.9 dBm. The chip area with pads is 0.75mm(2), and consumes 15.1 mW from 2.4 V.
引用
收藏
页码:95 / 106
页数:12
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