Modeling QCA defects at molecular-level in combinational circuits

被引:74
|
作者
Momenzadeh, M [1 ]
Ottavi, M [1 ]
Lombardi, F [1 ]
机构
[1] Northeastern Univ, Dept Elect & Comp Engn, Boston, MA 02115 USA
关键词
fault model; defect tolerance; QCA; emerging technology;
D O I
10.1109/DFTVS.2005.46
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper analyzes the deposition defects in devices and circuits made of Quantum-dot Cellular Automata (QCA) for molecular implementation. Differently from metal-based QCA, in this type of implementation a defect may occur due to the erroneous deposition of cells (made of molecules) on a substrate, i.e. no cell, or an additional cell is placed either near, or within the layout configuration of a QCA device. The effects of an erroneous cell deposition defect are analyzed by considering the induced functional faults for different QCA devices, such as the majority voter, the inverter and various wire configurations (straight, L-shape, coplanar crossing and fanout). Extensive simulation results am provided. As an example, testing of an EXOR circuit is analyzed in detail.
引用
收藏
页码:208 / 216
页数:9
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