Contribution of Lattice Defects to the Intensity of Quasi-Forbidden X-ray Reflections of Diamond: Comparison of X-Ray Topography and Infrared Spectroscopy Data

被引：4
|
作者：
Shiryaev, A. A. [1 ,2 ]
Zolotov, D. A. [3 ]
Suprun, E. M. [4 ]
Dyachkova, I. G. [3 ]
Ivakhnenko, S. A. [4 ]
Asadchikov, V. E. [3 ]
机构：
[1] Russian Acad Sci, Frumkin Inst Phys Chem & Electrochem, Moscow 119071, Russia
[2] Russian Acad Sci, Inst Geol Ore Deposits Petrog Mineral & Geochem, Moscow 119017, Russia
[3] Russian Acad Sci, Shubnikov Inst Crystallog, FSRC Crystallog & Photon, Moscow 119333, Russia
[4] Natl Acad Sci Ukraine, Bakul Inst Superhard Mat, UA-04074 Kiev, Ukraine
来源：
JETP LETTERS | 2020年 / 111卷 / 09期
关键词：
CRYSTALS;
D O I：
10.1134/S002136402009009X
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
New developments of application of X-ray topography in the quasi-forbidden (222) reflection from perfect crystals with diamond lattice to investigate defects are presented. The spatial distribution of intensities of (111) and (222) X-ray reflections is correlated with the distribution of point defects in synthetic diamonds of various types. It is shown that X-ray topography in the quasi-forbidden (222) reflection is a promising tool for investigation of weak stress fields in perfect crystals.
引用
收藏
页码：489 / 493
页数：5
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