High temperature study on the thermal properties of few-layer Mo0.5W0.5S2 and effects of capping layers

被引:7
|
作者
Gu, Hong [1 ,2 ]
Lu, Youming [1 ]
Zhu, Deliang [1 ]
Li, Kuilong [1 ]
Zheng, Shunan [3 ]
Wang, Jianfeng [3 ]
Ang, Kah-Wee [4 ]
Xu, Ke [3 ]
Liu, Xinke [1 ]
机构
[1] Shenzhen Univ, Coll Mat Sci & Engn, Guangdong Res Ctr Interfacial Engn Funct Mat, Chinese Engn & Res Inst Microelect,Shenzhen Key L, Shenzhen 518060, Peoples R China
[2] Shenzhen Univ, Coll Optoelect Engn, Key Lab Optoelect Devices & Syst, Minist Educ & Guangdong Prov, Shenzhen 518060, Peoples R China
[3] Chinese Acad Sci, Suzhou Inst Nanotech & Nanobion, Suzhou 215123, Peoples R China
[4] Natl Univ Singapore, Engn Dr 3, Singapore 117583, Singapore
基金
中国国家自然科学基金;
关键词
Mo0.5W0.5S2; TMDs; Thermal properties; High temperature; Capping layers; Raman; DEPENDENT RAMAN; MONOLAYER WS2; MOS2;
D O I
10.1016/j.rinp.2017.11.017
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigated the thermal properties of few-layer Mo0.5W0.5S2 using a series of samples with different kinds of capping layers. Temperature-dependent Raman measurements were conducted in the range of 300-500 K, with power-dependent measurements also carried out. It indicated, for the few-layer Mo0.5W0.5S2, the temperature coefficients of the WS2-like E-2g(1) mode, MoS2-like E-2g(1) mode and A(1g) mode were 0.0155 cm (1)/K, 0.0146 cm (1)/K, and 0.0130 cm (1)/K, respectively. And the thermal conductivity was estimated to be 44.8 W/mK. Moreover, the Mo0.5W0.5S2 samples coated with capping layers (ZrO2, HfO2) both showed a better thermal stability and a larger thermal conductivity than the one without. The results revealed that the capping layer should be an important factor in the thermal property. (C) 2017 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license
引用
收藏
页码:4394 / 4397
页数:4
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