Scanning impedance probe microscopy

被引：0
|
作者：
Han, Wenhai [1 ]
机构：
[1] Agilent Technol, Nanotechnol Measurements Div, Chandler, AZ USA
来源：
PHOTONICS SPECTRA | 2008年 / 42卷 / 05期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：58 / 59
页数：2
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