A portable system for monolithic active pixel sensors characterization

被引：0

作者：

Claus, G ^{[1
]}

Besson, A ^{[1
]}

Deptuch, G ^{[1
]}

Deveaux, M ^{[1
]}

Dulinski, W ^{[1
]}

Gaycken, G ^{[1
]}

Grandjean, D ^{[1
]}

Himmi, A ^{[1
]}

Jääskeläinen, K ^{[1
]}

Jalocha, P ^{[1
]}

Pellicioli, M ^{[1
]}

Winter, M ^{[1
]}

机构：

[1] ULP, IN2P3, LEPSI, F-67037 Strasbourg, France

来源：

2004 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-7 | 2004年

关键词：

D O I：

暂无

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

A Portable System For Monolithic Active Pixel Sensors Characterization has been developed, its main feature is flexibility. This system can be used for all prototypes tests stages, from functional test on wafer to tracking performances measurement with our beam telescope. It is built around a VME data acquisition system and ADC boards 12-bit 20 MHz. System control GUI, on-line monitoring, and data storage tasks are handled by a remote PC. A transparent access to raw data is provided which allows easy interface to both off-line and on-line analysis software. In order to increase system integration, a new generation of ADC board 14-bit 100 MHz, based on USB 2.0 bus, has been designed and tested. It will allow on-board data processing algorithm implementation in a Virtex II FPGA target.

引用

页码：1512 / 1516

页数：5

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