High-resolution x-ray diffraction from self-organized PbSe/PbEuTe quantum dot superlattices

被引:19
|
作者
Holy, V
Stangl, J
Springholz, G
Pinczolits, M
Bauer, G
机构
[1] Masaryk Univ, Fac Sci, Dept Solid State Phys, CS-61137 Brno, Czech Republic
[2] Johannes Kepler Univ, Inst Semicond Phys, A-4040 Linz, Austria
关键词
D O I
10.1088/0022-3727/34/10A/301
中图分类号
O59 [应用物理学];
学科分类号
摘要
High-resolution x-ray diffraction and grazing-incidence small-angle x-ray scattering are used for the investigation of the morphology of free-standing and buried self-assembled PbSe quantum dots in PbSe/PbEuTe superlattices. The measured data are simulated by means of kinematical and semikinematical scattering theories, and linear elasticity theory. The differences in the parameters of free-standing and buried dots yield a direct evidence of structure changes of self-assembled dots during their overgrowth.
引用
收藏
页码:A1 / A5
页数:5
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