The new external beam facility of the Oxford scanning proton microprobe

被引：25
|
作者：
Grime, GW [1 ]
Abraham, MH [1 ]
Marsh, MA [1 ]
机构：
[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2001年 / 181卷
关键词：
ion beam analysis; microbeam analysis; non-destructive analysis; PIXE; RBS;
D O I：
10.1016/S0168-583X(01)00616-4
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
This paper describes the development of a high spatial resolution external beam facility on one of the beamlines of the Oxford scanning proton microprobe tandem accelerator. Using a ma magnetic quadrupole doublet to focus the beam through the Kapton exit window a beam diameter of < 50 mum full width at half maximum (fwhm) can be achieved on a sample located at 4 mm from the exit window. The facility is equipped with two Si-Li X-ray detectors for proton-induced X-ray emission (PIXE) analysis of light and trace elements respectively, a surface barrier detector for Rutherford backscattering spectrometry (RBS) analysis and a HP-Ge detector for gamma -ray detection. The mechanical and beam-optical design of the system is described. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：66 / 70
页数：5
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