Considerations For Light Sources For Semiconductor Light Sensor Test

被引:0
|
作者
Buck, Martin [1 ]
机构
[1] Ams AG, Tamerton Rd, Plymouth, Devon, England
关键词
light source; sensor; LED (Light Emitting Diode); incandescent (INC); fluorescent (FL); high-intensity discharge (HID); Device Under Test (DUT); Near Infrared (NIR); Buried Quad Junction (BQJ);
D O I
暂无
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
There are an ever increasing number of applications for light sensors. These applications are getting increasingly more sophisticated; ranging from encoders for position sensing to ambient light sensors and proximity sensors for many consumer electronic devices. This presents a new challenge for test development engineers who now must include suitable light sources to test the sensor. The problem that may face the engineer is what needs to be considered when designing the light source. This paper discusses the basics of light source design and should provide the reader with an excellent base from which they can develop their own solutions.
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页数:6
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