Analysis of a two unit deteriorating standby system with repair

被引：6
|
作者：
Jacob, M
Narmada, S
Varghese, T
机构：
[1] School of Applicable Mathematics, M.G. University, Ettumanoor
来源：
MICROELECTRONICS AND RELIABILITY | 1997年 / 37卷 / 05期
关键词：
D O I：
10.1016/S0026-2714(96)00112-6
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper deals with the reliability analysis of a two unit standby system with repairs for common cause failure and critical human error. The deteriorating effect of the standby unit on the system is studied. Various measures of system effectiveness such as pointwise availability, steady-state availability,MTTF and variance of the time to failure of the system are obtained. Copyright (C) 1997 Elsevier Science Ltd.
引用
收藏
页码：857 / 861
页数：5
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