Non-destructive analysis of silver selenide films obtained by Pulsed Laser Deposition (PLD) with Micro-XRF

被引:6
|
作者
Dargel, Rainer
Azeroual, Mohamed
Mogwitz, Boris
Janek, Juergen
Vogt, Carla
机构
[1] Leibniz Univ Hannover, Inst Inorgan Chem, Dept Analyt Chem, D-30167 Hannover, Germany
[2] Univ Giessen, Inst Phys Chem, D-35392 Giessen, Germany
关键词
D O I
10.1007/s10853-006-1310-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin films of silver selenide with varying composition have been deposited on magnesium oxide substrates with pulsed laser deposition and were investigated via micro-XRF. A calibration procedure was designed to determine the absolute thicknesses of the films. The lateral homogeneity was investigated by elemental mapping, thus delivering information about the deposition process. Wet chemical analysis was performed on the dissolved layers with ICP-OES and ICP-MS to determine the stoichiometry of the Ag (x) Se (y) . The results suggest a correlation between the composition of the layers and their thicknesses by showing a silver enrichment for thinner layers.
引用
收藏
页码:7375 / 7380
页数:6
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