High-pressure x-ray tomography microscope: Synchrotron computed microtomography at high pressure and temperature

A new apparatus has been developed for microtomography studies under high pressure. The pressure generation mechanism is based on the concept of the widely used Drickamer anvil apparatus, with two opposed anvils compressed inside a containment ring. Modifications are made with thin aluminum alloy containment rings to allow transmission of x rays. Pressures up to 8 GPa have been generated with a hydraulic load of 25 T. The modified Drickamer cell is supported by thrust bearings so that the entire pressure cell can be rotated under load. Spatial resolution of the high pressure tomography apparatus has been evaluated using a sample containing vitreous carbon spheres embedded in FeS matrix, with diameters ranging from 0.01 to 0.2 mm. Spheres with diameters as small as 0.02 mm were well resolved, with measured surface-to-volume ratios approaching theoretical values. The sample was then subject to a large shear strain field by twisting the top and bottom Drickamer anvils. Imaging analysis showed that detailed microstructure evolution information can be obtained at various steps of the shear deformation, allowing strain partition determination between the matrix and the inclusions. A sample containing a vitreous Mg2SiO4 sphere in FeS matrix was compressed to 5 GPa, in order to evaluate the feasibility of volume measurement by microtomography. The results demonstrated that quantitative inclusion volume information can be obtained, permitting in situ determination of P-V-T equation of state for noncrystalline materials. (c) 2005 American Institute of Physics.