Feasibility of in-line instruments for high-resolution inelastic X-ray scattering

被引：3
|
作者：
Sturhahn, W. [1 ]
Toellner, T. S. [1 ]
机构：
[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
来源：
JOURNAL OF SYNCHROTRON RADIATION | 2011年 / 18卷
关键词：
X-ray optics; inelastic X-ray scattering; NUCLEAR RESONANT SCATTERING; MEV ENERGY RESOLUTION; SYNCHROTRON-RADIATION; MONOCHROMATOR; SPECTROSCOPY; MIRROR;
D O I：
10.1107/S0909049510053513
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Inelastic X-ray scattering instruments in operation at third-generation synchrotron radiation facilities are based on backreflections from perfect silicon crystals. This concept reaches back to the very beginnings of high-energy-resolution X-ray spectroscopy and has several advantages but also some inherent drawbacks. In this paper an alternate path is investigated using a different concept, the `M4 instrument'. It consists of a combination of two in-line high-resolution monochromators, focusing mirrors and collimating mirrors. Design choices and performance estimates in comparison with existing conventional inelastic X-ray scattering instruments are presented.
引用
收藏
页码：229 / 237
页数：9
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