Noise attributes of LWIR HDVIP HgCdTe detectors

被引:12
|
作者
D'Souza, A. I. [1 ]
Stapelbroek, M. G. [1 ]
Robinson, E. W. [1 ]
Yoneyama, C. [1 ]
Mills, H. A. [1 ]
Kinch, M. A. [2 ]
Skokan, M. R. [2 ]
Shih, H. D. [2 ]
机构
[1] DRS Sensors & Targeting Syst, Cypress, CA 90630 USA
[2] DRS Sensors & Targeting Syst, Infrared Technol Div, Dallas, TX 75243 USA
关键词
LWIR HgCdTe; 1/f noise;
D O I
10.1007/s11664-008-0432-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Time series and Fourier-transform data on high-density vertically integrated photodiodes (HDVIP) at 0 and 50 mV reverse bias in the dark have been studied. The detectors have a cutoff wavelength lambda(c) (60 K) of 10.5 mu m. Examination of the detector current time series and Fourier-transform curves of these devices reveals a variety of interesting characteristics: (i) time series displaying switching between four states characteristic of random telegraph signal (RTS) noise, the noise current power spectrum having Lorentzian or double Lorentzian type characteristics, (ii) time series data exhibiting wave-like characteristics with the noise current power spectrum being 1/f(2)-like at low frequencies, (iii) time series having a mean value independent of time with the noise current power spectrum being white, and (iv) time series nearly independent of time with the noise current power spectrum having 1/f characteristics. Although from a single array, the excess noise characteristics at low (mHz) frequencies were varied, most of the detectors measured fell into one of these four categories. The predominance of detectors examined had minimal excess low-frequency noise down to similar to 10 mHz. Detectors that displayed RTS noise in reverse bias were repeatable under subsequent measurement. However, when measured at zero bias, the same detectors exhibited no RTS noise, the noise current power spectrum being white in nature.
引用
收藏
页码:1318 / 1323
页数:6
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