Suppression of Intermixing in Strain-Relaxed Epitaxial Layers

被引:10
|
作者
Leontiou, T. [1 ]
Tersoff, J. [2 ]
Kelires, P. C. [1 ]
机构
[1] Cyprus Univ Technol, Dept Mech & Mat Sci Engn, CY-3036 Limassol, Cyprus
[2] IBM TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA
关键词
FIELD-EFFECT TRANSISTORS; SEMICONDUCTOR ALLOYS; BUFFER LAYERS; MOBILITY; SIGE;
D O I
10.1103/PhysRevLett.105.236104
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Misfit strain plays a crucial role in semiconductor heteroepitaxy, driving alloy intermixing or the introduction of dislocations. Here we predict a strong coupling between these two modes of strain relaxation, with unexpected consequences. Specifically, strain relaxation by dislocations can suppress intermixing between the heterolayer and the substrate. Monte Carlo simulations and continuum modeling show that the suppression, though not absolute, can be surprisingly large, even at high temperatures. The effect is strongest for a large misfit (e.g., InAs on GaAs) or for thin substrates (e.g., Ge on silicon on insulator).
引用
收藏
页数:4
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