X-ray absorption fine-structure determination of interfacial polarization in SrTiO3 thin films grown on Si(001)

被引：0

作者：

Woicik, J. C. ^{[1
]}

Aguirre-Tostada, F. S. ^{[2
]}

Herrera-Gomez, A. ^{[2
]}

Droopad, R. ^{[3
]}

Yu, Z. ^{[3
]}

Schlom, D. ^{[4
]}

Karapetrova, E. ^{[5
]}

Zschack, P. ^{[5
]}

Pianetta, P. ^{[6
]}

机构：

[1] NIST, Gaithersburg, MD 20899 USA

[2] CINVESTAV Quertero, Queretaro 76001, Mexico

[3] Motorola Inc, Phys Sci Res Labs, Tempe, AZ 85284 USA

[4] Penn State Univ, University Pk, PA 16802 USA

[5] Univ Illinois, APS UNICAT, Argonne Natl Lab, Argonne, IL 60439 USA

[6] Stanford Synchrotron Radiat Lab, Stanford, CA 94309 USA

来源：

PHYSICA SCRIPTA | 2005年 / T115卷

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Polarization-dependent X-ray absorption. ne structure together with X-ray diffraction have been used to study the local structure in SrTiO(3) thin films grown on Si(001). Our data indicate that an interfacial polarization of the SrTiO(3) layer by the Si substrate results in a tetragonal distortion of the SrTiO(3) unit cell.

引用

页码：620 / 622

页数：3

共 50 条

[1] Ferroelectric distortion in SrTiO3 thin films on Si(001) by x-ray absorption fine structure spectroscopy:: Experiment and first-principles calculations
Woicik, J. C.
Shirley, E. L.
Hellberg, C. S.
Andersen, K. E.
Sambasivan, S.
Fischer, D. A.
Chapman, B. D.
Stern, E. A.
Ryan, P.
Ederer, D. L.
Li, H.
[J]. PHYSICAL REVIEW B, 2007, 75 (14):
[2] Interfacial and microstructural properties of SrTiO3 thin films grown on Si(001) substrates
He, JQ
Regnery, S
Jia, CL
Qin, YL
Fitsilis, F
Ehrhart, P
Waser, R
Urban, K
Wang, RH
[J]. JOURNAL OF APPLIED PHYSICS, 2002, 92 (12) : 7200 - 7205
[3] Surface and interfacial structure of epitaxial SrTiO3 thin films on (001) Si grown by molecular beam epitaxy
Niu, F.
Wessels, B. W.
[J]. JOURNAL OF CRYSTAL GROWTH, 2007, 300 (02) : 509 - 518
[4] Displacive phase transition in SrTiO3 thin films grown on Si(001)
Aguirre-Tostado, FS
Herrera-Gómez, A
Woicik, JC
Droopad, R
Yu, Z
Schlom, DG
Karapetrova, J
Zschack, P
Pianetta, P
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2004, 22 (04): : 1356 - 1360
[5] X-RAY ABSORPTION FINE-STRUCTURE OF DIAMOND FILMS GROWN BY CHEMICAL VAPOR-DEPOSITION
CAPEHART, TW
PERRY, TA
BEETZ, CB
BELTON, DN
FISHER, GB
BEALL, CE
YATES, BN
TAYLOR, JW
[J]. APPLIED PHYSICS LETTERS, 1989, 55 (10) : 957 - 959
[6] X-ray absorption fine structure studies of Mn coordination in doped perovskite SrTiO3
Levin, I.
Krayzman, V.
Woicik, J. C.
Tkach, A.
Vilarinho, P. M.
[J]. APPLIED PHYSICS LETTERS, 2010, 96 (05)
[7] X-ray study of SrTiO3 thin films in multilayer structures
Petrov, PK
Ivanov, ZG
Gevorgyan, SS
[J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2000, 288 (02): : 231 - 234
[8] Interface structure and thermal stability of epitaxial SrTiO3 thin films on Si (001)
Goncharova, L.V.
Starodub, D.G.
Garfunkel, E.
Gustafsson, T.
Vaithyanathan, V.
Lettieri, J.
Schlom, D.G.
[J]. Journal of Applied Physics, 2006, 100 (01):
[9] Atomic structure of the interface between SrTiO3 thin films and Si(001) substrates
Mi, Shao-Bo
Jia, Chun-Lin
Vaithyanathan, Venu
Houben, Lothar
Schubert, Juergen
Schlom, Darrell G.
Urban, Knut
[J]. APPLIED PHYSICS LETTERS, 2008, 93 (10)
[10] Interface structure and thermal stability of epitaxial SrTiO3 thin films on Si(001)
Goncharova, L. V.
Starodub, D. G.
Garfunkel, E.
Gustafsson, T.
Vaithyanathan, V.
Lettieri, J.
Schlom, D. G.
[J]. JOURNAL OF APPLIED PHYSICS, 2006, 100 (01)

← 1 2 3 4 5 →