Simulation and determination of the Goss texture in grain-oriented silicon steel

A new approach to simulating the orientation distribution function (ODF) using one diffraction frame collected by X-ray two-dimensional detector is proposed. Based on the concept that the texture component presents a normal distribution form, the volume fraction and the orientation spread of texture component are obtained using curve fitting method from diffraction profile and, the pole figures as well as ODF can be calculated. Thus the texture of grain-oriented silicon steel is determined rapidly and conveniently. A comparison of the simulation ODF with that reconstructed from experimental pole figures by series expansion is presented and the results show that the new approach works correctly.