Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout

被引:3
|
作者
Hidalgo-Lopez, Jose A. [1 ]
Sanchez-Duran, Jose A. [1 ,2 ]
Oballe-Peinado, Oscar [1 ,2 ]
机构
[1] Univ Malaga, Dept Elect, Andalucia Tech, Campus Teatinos, Malaga 29071, Spain
[2] Inst Invest Biomed Malaga IBIMA, Malaga 29010, Spain
关键词
direct interface circuits; calibration methods; error analysis; resistive sensor; interface sensor; time-based measurement; CALIBRATION; REDUCTION;
D O I
10.3390/s20092596
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Direct Interface Circuits (DICs) carry out resistive sensor readings using a resistance-to-time-to-digital conversion without the need for analog-to-digital converters. The main advantage of this approach is the simplicity involved in designing a DIC, which only requires some additional resistors and a capacitor in order to perform the conversion. The main drawback is the time needed for this conversion, which is given by the sum of up to three capacitor charge times and their associated discharge times. This article presents a modification of the most widely used estimation method in a resistive DIC, which is known as the Two-Point Calibration Method (TPCM), in which a single additional programmable digital device pin in the DIC and one extra measurement in each discharge cycle, made without slowing down the cycle, allow charge times to be reduced more than 20-fold to values around 2 mu s. The new method designed to achieve this reduction only penalizes relative errors with a small increase of between 0.2% and 0.3% for most values in the tested resistance range.
引用
收藏
页数:13
相关论文
共 50 条
  • [1] Fast Calibration Methods for Resistive Sensor Readout Based on Direct Interface Circuits
    Hidalgo-Lopez, Jose A.
    Botin-Cordoba, Jesus A.
    Sanchez-Duran, Jose A.
    Oballe-Peinado, Oscar
    [J]. SENSORS, 2019, 19 (18)
  • [2] Sigma-Delta Approach in Direct Interface Circuits for Readout of Resistive Sensors
    Hidalgo-Lopez, Jose A.
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 71
  • [3] Reducing Readout Complexity of Large Resistive Sensor Arrays
    Saxena, R. S.
    Bhan, R. K.
    Aggrawal, A.
    [J]. IEEE SENSORS JOURNAL, 2008, 8 (11-12) : 1862 - 1863
  • [4] Improved Circuits with Capacitive Feedback for Readout Resistive Sensor Arrays
    Oballe-Peinado, Oscar
    Vidal-Verdu, Fernando
    Sanchez-Duran, Jose A.
    Castellanos-Ramos, Julian
    Hidalgo-Lopez, Jose A.
    [J]. SENSORS, 2016, 16 (02)
  • [5] A highly programmable sensor network interface with multiple sensor readout circuits
    Zhang, JC
    Zhou, JW
    Balasundaram, P
    Mason, A
    [J]. PROCEEDINGS OF THE IEEE SENSORS 2003, VOLS 1 AND 2, 2003, : 748 - 752
  • [6] A 10 ms-readout Interface For Experimental Resistive Sensor Characterization
    Depari, A.
    Flammini, A.
    Marioli, D.
    Sisinni, E.
    Comini, E.
    Ponzoni, A.
    [J]. OLFACTION AND ELECTRONIC NOSE, PROCEEDINGS, 2009, 1137 : 220 - +
  • [7] Direct interface circuit to linearise resistive sensor bridges
    Sifuentes, Ernesto
    Casas, Oscar
    Reverter, Ferran
    Pallas-Areny, Ramon
    [J]. SENSORS AND ACTUATORS A-PHYSICAL, 2008, 147 (01) : 210 - 215
  • [8] An improved readout topology of resistive sensor array for reduced measurement error
    Talib, Dayang Nurul Nahar
    Shafie, Suhaidi
    Hamidon, Mohd Nizar
    Ahmad, Pauzan
    [J]. 2015 IEEE INTERNATIONAL CIRCUITS AND SYSTEMS SYMPOSIUM (ICSYS), 2015, : 96 - 99
  • [9] Resistive sensor interface circuits using operational conveyor and operational amplifier
    Faculty of Engineering, King Mongkut's Institute of Technology Ladkrabang, Ladkrabang, Bangkok 10520, Thailand
    不详
    不详
    [J]. ICIC Express Lett, 2012, 3 (651-656):
  • [10] Direct interface circuits for resistive sensors affected by lead wire resistances
    Hidalgo-Lopez, Jose A.
    [J]. MEASUREMENT, 2023, 218