Structural Health Monitoring: Subsurface Defects Detection

被引：1

作者：

Leong, Wai Yie ^{[1
]}

Wei, Liu ^{[1
]}

机构：

[1] Singapore Inst Mfg Technol, 71 Nanyang Dr, Singapore 638075, Singapore

来源：

IECON: 2009 35TH ANNUAL CONFERENCE OF IEEE INDUSTRIAL ELECTRONICS, VOLS 1-6 | 2009年

关键词：

defect characterization; signal processing; ultrasonic; non-destructive testing (NUT); GUIDED-WAVES;

D O I：

10.1109/IECON.2009.5414919

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, the operation of the non-destructive inspection on composite structures has been investigated. The pitch/catch swept is used to detect the designed flaws of the laminated composite structures. Characteristics of the different types of defect are inspected. The signal processing is applied to the collected data to extract the defect information. The smallest detectable defect size is found to be approximately the size of the probe used. The results based on several defects are presented and compared.

引用

页码：4326 / 4330

页数：5

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