Third-order susceptibility measurements by nonlinear image processing

被引:31
|
作者
Boudebs, G
Chis, M
Bourdin, JP
机构
[1] Lab. Proprietes Optiques Mat. A., Université d'Angers, 49045 Angers Cedex 01, 2, boulevard Lavoisier
关键词
D O I
10.1364/JOSAB.13.001450
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present a two-wave mixing configuration associated with a coherent optical processor (4-f system) to characterize the third-order susceptibility coefficient. An accurate measurement of the spatial structure of the intensity becomes possible with a CCD camera, which simplifies and improves the accuracy of third-order susceptibility measurements. To verify the validity of the method, measurements of reference materials illuminated by linearly polarized light are carried out. Good agreement with other measurements by various authors is obtained. (C) 1996 Optical Society of America
引用
收藏
页码:1450 / 1456
页数:7
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