Narrow Ferromagnetic Resonance Linewidth Polycrystalline Zn-Ferrite Thin Films

被引：17
|
作者：
Bohra, Murtaza [1 ,2 ]
Prasad, Shiva [1 ]
Venkataramani, N. [1 ]
Kumar, Naresh [3 ]
Sahoo, S. C. [1 ]
Krishnan, R. [4 ]
机构：
[1] Indian Inst Technol, Bombay 400076, Maharashtra, India
[2] Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung, Taiwan
[3] Motilal Nehru Natl Inst Technol, Allahabad 211004, Uttar Pradesh, India
[4] Univ Versailles St Quentin, CNRS, Grp Etud Mat Condensee, Versailles, France
来源：
IEEE TRANSACTIONS ON MAGNETICS | 2011年 / 47卷 / 02期
关键词：
Ferromagnetic resonance; linewidth; nano-crystalline ferrite thin films; Zn-ferrite; ZNFE2O4; MAGNETIZATION; TEMPERATURE;
D O I：
10.1109/TMAG.2010.2081664
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Ferromagnetic resonance at 9.5 GHz was performed on ferrimagnetic nano-crystalline Zn-ferrite thin films deposited under different preparation conditions. A very low line width of 40 Oe was observed in as-sputtered 100 W thin films in perpendicular configuration. The pulsed laser deposited films show comparatively higher line widths. This work shows that it is possible to deposit ferrite thin films with low line width and good magnetization values without going through a high temperature processing.
引用
收藏
页码：345 / 348
页数：4
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