Reliability Analysis of Operating Systems for Embedded SoC

被引:0
|
作者
Santini, Thiago [1 ]
Carro, Luigi [1 ]
Wagner, Flavio Rech [1 ]
Rech, Paolo [1 ]
机构
[1] Univ Fed Rio Grande do Sul, Inst Informat, Av Bento Goncalves,9500 Campus Vale Bloco 4, Porto Alegre, RS, Brazil
关键词
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暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we investigate how the presence of a general purpose operating system influences the reliability of modern embedded Systems-on-Chips (SoCs). We experimentally study the difference in the neutron-induced error rate of SoCs when executing the application bare to the metal and on top of the Linux kernel. Our analysis demonstrates that Linux presence barely affects the Silent Data Corruption (SDC) rate while it greatly increases the system Functional Interruption (SEFI) rate (up to 7.48 times) if no preventive measures are taken. Furthermore, we analytically show that cache conflicts between the operating system and application can significantly reduce the Linux-induced SEFI rate increase. Additionally, we evaluate the OS software stack masking effect and show that the higher the abstraction layer in which an application is implemented, the lower its SDC rate.
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页数:5
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