Roundtable: Reliability of Embedded and Cyber-Physical Systems

被引：6
|
作者：
Barnum, Sean
Sastry, Shankar [1 ]
Stankovic, John A. [2 ]
机构：
[1] Univ Calif Berkeley, Berkeley, CA 94720 USA
[2] Univ Virginia, Dept Comp Sci, Charlottesville, VA 22903 USA
来源：
IEEE SECURITY & PRIVACY | 2010年 / 8卷 / 05期
关键词：
cyberphysical systems; embedded systems; healthcare; reliability; smart grid;
D O I：
10.1109/MSP.2010.162
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
As part of this special issue, the guest editors put together a roundtable discussion to delve into topics the chosen articles didn't touch upon. Sean Barnum (MITRE); Shankar Sastry (UC Berkeley); and John A. Stankovic (University of Virginia) spoke on many topics. © 2006 IEEE.
引用
收藏
页码：27 / 32
页数：6
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