REVIEW OF RECENT DEVELOPMENTS OF SPATIAL PHASE-SHIFT DIGITAL SHEAROGRAPHY

In the last decade, due to the fast development of phase-shift technique, the measurement sensitivity of digital shearography (DS) technology has been increased tens of times which brings the technology itself a wide acceptance by the industry as a practical measurement tool for quality inspection and non-destructive testing. In common sense, compare to Temporal Phase-Shift Digital Shearography (TPS-DS), Spatial Phase-Shift Digital Shearograhy (SPS-DS) has the advantage of a broader capability for both static and dynamic measurement applications while keeps the disadvantage of lower phase-map quality. Recently, with new developments, the phase map quality of spatial phase-shift digital shearography has been greatly improved which is now comparable to the temporal phase-shift technique. This article gives a review of recent developments of spatial phase-shift digital shearography. Theory, experimental setup, phase-map results and applications are shown in detail.