Optimization of a coherent soft x-ray beamline for coherent scattering experiments at NSLS-II

被引:0
|
作者
Shapiro, David A. [1 ]
Chubar, Oleg [1 ]
Kaznatcheev, Konstantine [1 ]
Reininger, Ruben [1 ]
Sanchez-Hanke, Cecilia [1 ]
Wang, Shengyu [1 ]
机构
[1] Brookhaven Natl Lab, Natl Synchrotron Light Source 2, Upton, NY 11793 USA
关键词
coherence; undulator; ptychography; RADIATION; MICROSCOPY;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The coherent soft x-ray and full polarization control (CSX) beamline at the National Synchrotron Light Source - II (NSLS-II) will deliver 1013 coherent photons per second in the energy range of 0.2-2 keV with a resolving power of 2000. The source, a dual elliptically polarizing undulator (EPU), and beamline optics should be optimized to deliver the highest possible coherent flux in a 10-30 mu m spot for use in coherent scattering experiments. Using the computer code Synchrotron Radiation Workshop (SRW), we simulate the photon source and focusing optics in order to investigate the conditions which provide the highest usable coherent intensity on the sample.(1-3) In particular, we find that an intermediate phasing magnet is needed to correct for the relative phase between the two EPUs and that the optimum phase setting produces a spectrum in which the desired wavelength is slightly red-shifted thus requiring a larger aperture than originally anticipated. This setting is distinct from that which produces an on-axis spectrum similar to a single long undulator. Furthermore, partial coherence calculations, utilizing a multiple electron approach, indicate that a high degree of spatial coherence is still obtained at the sample location when such an aperture is used. The aperture size which maximizes the signal-to-noise ratio of a double-slit experiment is explored. This combination of high coherence and intensity is ideally suited for x-ray ptychography experiments which reconstruct the scattering density from micro-diffraction patterns. This technique is briefly reviewed and the effects on the image quality of proximity to the beamline focus are explored.
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页数:6
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