Application of direct current electrical potential method to multiple inner cracks

被引：0
|
作者：
Tada, N
Hayashi, Y
Kitamura, T
Ohtani, R
机构：
来源：
ELECTROMAGNETIC NONDESTRUCTIVE EVALUATION | 1997年 / 12卷
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Direct current potential field around multiple inner cracks was analyzed by Crack-Flow Modification Method (CFMM) in order to evaluate the change in the potential difference of a round bar specimen failed under a creep-fatigue condition. The results of the analysis showed that the creep-fatigue damage by multiple inner cracking can be detected around half of the lifetime assuming that a change of 1% in the potential difference is measurable by a voltmeter.
引用
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页码：171 / 176
页数：6
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