Vector magnetization imaging in ferromagnetic thin films using soft x-rays

被引:27
|
作者
Kim, SK [2 ]
Kortright, JB
Shin, SC
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
[2] Korea Adv Inst Sci & Technol, Dept Phys, Taejon 305701, South Korea
[3] Korea Adv Inst Sci & Technol, Ctr Nanospin Spintron Mat, Taejon 305701, South Korea
关键词
D O I
10.1063/1.1370120
中图分类号
O59 [应用物理学];
学科分类号
摘要
A magnetization vector M imaging using a transmission x-ray microscope with magnetic circular dichroism (MCD) contrast is demonstrated. MCD images through a semitransparent, 33-nm-thick Fe film are measured at the Fe L-3 edge along three different x-ray propagation directions to determine all three components of the M. The transmission images clearly display the vector nature of complex microstructures, associated with the M reversal between oppositely oriented 180 degrees domains, including not only 90 degrees domains, a Neel wall-like structure, and an extended ripple structure, but also a striking feature of localized magnetization spirals with perpendicular components at their cores. These studies have important implications for applications of this technique to better understand the expected features as well as details of domain-wall structures. (C) 2001 American Institute of Physics.
引用
收藏
页码:2742 / 2744
页数:3
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