Magnetization Reversal in Different Magnetic Thin Films Studied Using a Magnetic Actuator

被引:1
|
作者
Hsieh, Yi-Ping [1 ]
Wei, Zung-Hang [1 ]
Yip, Ming-Chuen [1 ]
机构
[1] Natl Tsing Hua Univ, Dept Power Mech Engn, Hsinchu 300, Taiwan
关键词
D O I
10.1143/JJAP.50.106601
中图分类号
O59 [应用物理学];
学科分类号
摘要
We propose a novel method for observing the magnetization reversal of ferromagnetic thin film; the novel method is to observe the deflection of a magnetic actuator under various magnetic fields. However, they are necessary that the magnetic actuator is bent using a ferromagnetic thin film and that the deflection of the magnetic actuator is obvious enough to study the magnetization reversal of the ferromagnetic thin film. The magnetic actuator consisting of a 76 x 0.75 x 0.3 mu m(3) silicon oxide microcantilever and a 75 x 9 x 0.3 mu m(3) silicon oxide plate deposited on a ferromagnetic multilayer thin film is successfully fabricated using electron beam lithography and electron beam evaporation, and placed in various magnetic fields to observe its flexure. In this study, three shapes of magnetic element are designed: 60 x 1 x 0.09 mu m(3), 60 x 3 x 0.09 mu m(3), and 60 x 6 x 0.09 mu m(3). In the sweep-down process, the magnetization of the 60 x 6 x 0.09 mu m(3) ferromagnetic thin film is reversed at -147 G; the magnetization of the 60 x 3 x 0.09 mu m(3) ferromagnetic thin film is reversed at -313 G; and the magnetization of the 60 x 6 x 0.09 mu m(3) ferromagnetic thin film is reversed at -643 G. The study is useful for applications of the magnetic actuator. (C) 2011 The Japan Society of Applied Physics
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页数:5
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