The speckle phenomenon as introduction to optical metrology in educational laboratory

被引:0
|
作者
da Silva, Emerson Rodrigo [1 ]
Muramatsu, Mikiya [1 ]
机构
[1] Univ Sao Paulo, Inst Fis, Lab Opt, BR-01498 Sao Paulo, SP, Brazil
来源
关键词
speckle; metrology; interferometry;
D O I
暂无
中图分类号
G40 [教育学];
学科分类号
040101 ; 120403 ;
摘要
In this work we present the measurement of the linear coefficient of thermal dilatation of aluminium, using the obtained interferogram from Fourier transform over the sum of two displaced speckle images. The achieved result is in good agreement with tabled value and the required components have an accessible cost, turning the experiment an. interesting alternative for introduction of optical metrology in teaching laboratory or a project to be developed in experimental subjects.
引用
收藏
页码:283 / 286
页数:4
相关论文
共 50 条
  • [1] Virtual optical laboratory for speckle metrology
    Kornis, J
    [J]. OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION III, 2003, 5144 : 872 - 879
  • [2] Virtual optical laboratory for speckle metrology
    Kornis, J
    Németh, A
    Füzessy, Z
    [J]. OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION II: APPLICATIONS IN PRODUCTION ENGINEERING, 2001, 4399 : 116 - 123
  • [3] Speckle 2012: V International Conference on Speckle Metrology Introduction
    Doval, Angel F.
    Trillo, Cristina
    Lopez-Vazquez, J. Carlos
    [J]. SPECKLE 2012: V INTERNATIONAL CONFERENCE ON SPECKLE METROLOGY, 2012, 8413 : XV - XVI
  • [4] HOLOGRAPHIC, SPECKLE AND MOIRE TECHNIQUES IN OPTICAL METROLOGY
    BRIERS, JD
    [J]. PROGRESS IN QUANTUM ELECTRONICS, 1993, 17 (03) : 167 - 233
  • [5] USE OF HOLOGRAPHIC OPTICAL-ELEMENTS IN SPECKLE METROLOGY
    SHAKHER, C
    RAO, GV
    [J]. APPLIED OPTICS, 1984, 23 (24): : 4592 - 4595
  • [6] Optical vortex metrology for nanometric speckle displacement measurement
    Wang, W
    Yokozeki, T
    Ishijima, R
    Wada, A
    Miyamoto, Y
    Takeda, M
    Hanson, SG
    [J]. OPTICS EXPRESS, 2006, 14 (01): : 120 - 127
  • [7] Speckle Metrology
    Doval, Angel F.
    Trillo, Cristina
    Carlos Lopez-Vazquez, Jose
    [J]. OPTICAL ENGINEERING, 2013, 52 (10)
  • [8] Speckle Metrology
    Mendoza Santoyo, Fernando
    Georges, Marc
    Lehmann, Peter
    Osten, Wolfgang
    Armando, Albertazzi G., Jr.
    [J]. OPTICAL ENGINEERING, 2016, 55 (12)
  • [9] Advances in optical metrology and instrumentation: introduction
    Ellis, Jonathan D.
    Haitjema, Han
    Jiang, Xiangqian
    Joo, Ki-Nam
    Leach, Richard
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2020, 37 (09) : OMI1 - OMI2
  • [10] SPATIALLY MULTIPLEXED OPTICAL CORRELATION FOR DISPLACEMENT MAPPING IN SPECKLE METROLOGY
    HINSCH, K
    ARNOLD, W
    [J]. HOLOGRAPHIC OPTICS II : PRINCIPLES AND APPLICATIONS, 1989, 1136 : 327 - 334